About Us

New Equipment
Division

Pre-Owned
Equipment
Division

AMAT P5000
AMAT Spare Parts
Diffusion
-Dispatch Conveyor
       Furnace Model
       14410-NS
Metrology
Ovens
Photolithography
Pumps
Solar
-ASM Epsilon 2000
       Epi Reactor
-Alcatel DRIE
-Dispatch Conveyor
       Furnace Model
       14410-NS
-Schmid Light
       Induced Plater (LIP)
-SELA Sample Prep
       for Failure Analysis
       for SEM and TEM
-EEJA (Electro Plating
       -Engineers of
        Japan) Ni and
        Ag Plating
        System
-Schmid Light
       Induced Plater (LIP)
-EVG101 Coater
-Thermco Maxibrute
       200mm Oxidation
       Furnace
-Spare Parts
-Vacuum
-Wet Process
-Additional
     Equipment

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METROLOGY EQUIPMENT

Conquer Industries strives to provide quality pre-owned equipment at reasonable prices. Below is a sampling from our current inventory. Of course, many other types of equipment are available, please call us to discuss these systems, or any other equipment needs you may have.

SELA Sample Prep for Failure Analysis for SEM and TEM (NEW ITEM) Call for pricing
 

Tool configuration:

TEM701 - EM2 - TEM/STEM & SEM sample preparation system
MC0382 Long Working Distance 100X Objective
ASO770 300mm Universal Wafer Holder and Navigation Option
ASO760 High Magnification Option (HMO)
ASO440 Maintenance
ASD710 50 Process Side View Kit
ASD780 100 No Stub Process Kit

UltraPoint 1000 CALL FOR PRICE
  Call for details and additional information.
Prometrix SM200e CALL FOR PRICE
  Fully rebuilt with a warranty. Contact us for details.
UNITRON UNIMET 7187 CALL FOR PRICE
  Inverted Metallurgical Microscope


Click HERE for additional information (PDF)

Rudolph Ellipsometer Auto EL IV CALL FOR PRICE
  Excellent Condition, In Stock and Operational!!

The Auto EL IV is an ellipsometer designed to provide precise film thickness measures. This tool has a non-volatile memory, allowing users to retrieve previously determined sample parameters. The system's thermal printer can provide a hard copy of the results as well.

Rudolph Research Auto EL IV Ellipsometer Features/Specificatons:
  1. Multi-Wavelength: uses light at 3 different wavelengths
  2. Wavelength: 633, 576, 405nm
  3. Automatic R-06" sample stage: movement can be pre-programmed or controlled via joystick
  4. Tungsten halogen laser
  5. Includes micro-spot
  6. Measuring time: 17 - 50 seconds
  7. Operating wavelength:
    • Polarizer or analyzer: 0.05°
    • DELTA: 0.1°
    • PSI 0.05
  8. SECS II Interface
  9. Internal data reduction software
  10. Built in Printer
  11. Maximum sample size: 150mm